Invention Grant
- Patent Title: Address fault detection in a flash memory system
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Application No.: US16551593Application Date: 2019-08-26
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Publication No.: US10692548B2Publication Date: 2020-06-23
- Inventor: Hieu Van Tran , Xian Liu , Nhan Do
- Applicant: Silicon Storage Technology, Inc.
- Applicant Address: US CA San Jose
- Assignee: SILICON STORAGE TECHNOLOGY, INC.
- Current Assignee: SILICON STORAGE TECHNOLOGY, INC.
- Current Assignee Address: US CA San Jose
- Agency: DLA Piper LLP US
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C7/10 ; G11C8/12 ; H01L27/11521 ; H01L21/28 ; G11C16/08 ; G11C29/02 ; H01L29/423 ; H01L29/66 ; H01L29/788 ; G11C8/08 ; G11C8/10 ; G11C16/04 ; G11C29/12 ; H01L27/11524

Abstract:
A system and method are disclosed for performing address fault detection in a flash memory system. In one embodiment, a flash memory system comprises a memory array comprising flash memory cells arranged in rows and columns, a row decoder for receiving a row address as an input, the row decoder coupled to a plurality of word lines, wherein each word line is coupled to a row of flash memory cells in the memory array, an address fault detection array comprising a column of memory cells, wherein each of the plurality of word lines is coupled to a memory cell in the column, and an analog comparator for comparing a current drawn by the column with a reference current and for indicating a fault if the current drawn by the column exceeds the reference current.
Public/Granted literature
- US20190378548A1 Address Fault Detection In A Flash Memory System Public/Granted day:2019-12-12
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