Invention Grant
- Patent Title: Measurement and inspection device
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Application No.: US16251563Application Date: 2019-01-18
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Publication No.: US10692687B2Publication Date: 2020-06-23
- Inventor: Wen Li , Shinichi Murakami , Hiroyuki Takahashi , Yuko Sasaki , Minoru Yamazaki , Hajime Kawano
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6c575f02
- Main IPC: H01J37/147
- IPC: H01J37/147 ; H01J37/04 ; G01N23/2251 ; H01L21/66

Abstract:
A low noise blanking unit corresponds to a wide range of acceleration voltages (from several times higher than related voltages to low acceleration voltages) of an electron beam. A blanking unit of the measurement and inspection device includes a blanking control circuit, in which (i) an upper and a lower blanking electrodes are arranged in the irradiation direction of an electron beam; electrodes on the reverse sides of two opposing electrodes in each of the blanking electrodes arranged in the same direction are connected with the ground, (ii) when blanking is ON, positive voltages are output to remaining electrodes of the upper blanking electrode and negative voltages are output to remaining electrodes of the lower blanking electrode, and (iii) when the blanking is OFF, the same ground reference signal is output to the remaining electrodes of the upper blanking electrode and to the remaining electrodes of the lower blanking electrode.
Public/Granted literature
- US20190318906A1 MEASUREMENT AND INSPECTION DEVICE Public/Granted day:2019-10-17
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