Invention Grant
- Patent Title: System and method for calculating substrate support temperature
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Application No.: US15824447Application Date: 2017-11-28
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Publication No.: US10725485B2Publication Date: 2020-07-28
- Inventor: David Joseph Wetzel , Alexander Bleakie , Jacob Frederick Theisen
- Applicant: LAM RESEARCH CORPORATION
- Applicant Address: US CA Fremont
- Assignee: LAM RESEARCH CORPORATION
- Current Assignee: LAM RESEARCH CORPORATION
- Current Assignee Address: US CA Fremont
- Main IPC: G05D23/24
- IPC: G05D23/24 ; G05D23/19 ; G01K13/02 ; H04L21/00 ; G01K7/42 ; G01R21/14 ; G01R21/127

Abstract:
A temperature controller for a substrate support in a substrate processing system includes a power parameter module configured to calculate a power parameter indicative of power supplied to the substrate support. A coolant temperature parameter module configured to calculate a coolant temperature parameter indicative of a temperature of a coolant supplied to the substrate support. A heat transfer gas parameter module is configured to calculate a heat transfer gas parameter indicative of flow rates of a heat transfer gas supplied to the substrate support. A temperature calculation module is configured to calculate a temperature of the substrate support using the power parameter, the coolant temperature parameter, and the heat transfer gas parameter.
Public/Granted literature
- US20180173255A1 SYSTEM AND METHOD FOR CALCULATING SUBSTRATE SUPPORT TEMPERTURE Public/Granted day:2018-06-21
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