Invention Grant
- Patent Title: Calibration of microscopy systems
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Application No.: US14934412Application Date: 2015-11-06
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Publication No.: US10746980B2Publication Date: 2020-08-18
- Inventor: Kevin Bernard Kenny , Alex David Corwin , David Andrew Shoudy , Christine Lynne Surrette
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Eversheds Sutherland (US) LLP
- Main IPC: G02B21/36
- IPC: G02B21/36 ; H04N17/00 ; H04N5/262 ; H04N5/235 ; H04N5/217 ; G01N21/27 ; G01J1/02 ; G01N21/64

Abstract:
Approaches are disclosed for calibrating a plurality of imaging devices, such as microscopes. In certain implementations, a calibration plate is employed that includes a variety of calibration features. The calibration features comprise a geometric calibration, an illumination calibration, and an optical calibration. Imaging devices calibrated in accordance with the present approaches may be used to generate images having consistent attributes, such as brightness, regardless of which imaging device is employed.
Public/Granted literature
- US20160170197A1 CALIBRATION OF MICROSCOPY SYSTEMS Public/Granted day:2016-06-16
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