Invention Grant
- Patent Title: Aberration corrector and charged particle beam device
-
Application No.: US16364726Application Date: 2019-03-26
-
Publication No.: US10755888B2Publication Date: 2020-08-25
- Inventor: Shigeyuki Morishita
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1e52f689
- Main IPC: H01J37/10
- IPC: H01J37/10 ; H01J37/28 ; H01J37/153

Abstract:
An aberration corrector includes: a first multipole, a second multipole, a third multipole, and a fourth multipole arranged along an optical axis A; a first transfer lens system arranged between the first multipole and the second multipole; a second transfer lens system arranged between the second multipole and the third multipole; and a third transfer lens system arranged between the third multipole and the fourth multipole, wherein each of the first multipole, the second multipole, the third multipole, and the fourth multipole generates a three-fold symmetric field.
Public/Granted literature
- US20190304739A1 Aberration Corrector and Charged Particle Beam Device Public/Granted day:2019-10-03
Information query