Invention Grant
- Patent Title: Automatic analyzing apparatus
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Application No.: US15325519Application Date: 2015-06-15
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Publication No.: US10761105B2Publication Date: 2020-09-01
- Inventor: Yoshiki Muramatsu , Takamichi Mori , Kazuhiro Nakamura
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@37de441
- International Application: PCT/JP2015/067112 WO 20150615
- International Announcement: WO2016/009765 WO 20160121
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N21/11 ; G01N21/25 ; G01N33/487 ; G01N35/04 ; G01N33/49 ; G01N33/493

Abstract:
An automatic analyzing apparatus is provided which includes a member 401 fixed at a predetermined level which presses down the sample container sealed with the sealing plug that is floated from the rack due to friction between the probe and the sealing plug when pulling out the probe from the sample container sealed with the sealing plug, and a mechanism 402 that pushes down, toward the rack, the sample container sealed with the floated sealing plug in which the sample container sealed with the floated sealing plug is transported by the transport line, and disposed on a path of the transport line until re-inspection is performed after pulling out the probe from the sample container sealed with the sealing plug.
Public/Granted literature
- US20170176484A1 AUTOMATIC ANALYZING APPARATUS Public/Granted day:2017-06-22
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