- Patent Title: Memory devices and methods for read disturb mitigation involving word line scans to detect localized read disturb effects and to determine error count in tracked sub sets of memory addresses
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Application No.: US16416177Application Date: 2019-05-18
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Publication No.: US10770156B2Publication Date: 2020-09-08
- Inventor: Renato C. Padilla , Jung Sheng Hoei , Michael G. Miller , Roland J. Awusie , Sampath K. Ratnam , Kishore Kumar Muchherla , Gary F. Besinga , Ashutosh Malshe , Harish R. Singidi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C11/56

Abstract:
A memory device comprising a main memory and a controller operably connected to the main memory is provided. The main memory can comprise a plurality of memory addresses, each corresponding to a single one of a plurality of word lines. Each memory address can be included in a tracked subset of the plurality of memory addresses. Each tracked subset can include memory addresses corresponding to more than one of the plurality of word lines. The controller is configured to track a number of read operations for each tracked subset, and to scan, in response to the number of read operations for a first tracked subset exceeding a first threshold value, a portion of data corresponding to each word line of the first tracked subset to determine an error count corresponding to each word line of the first tracked subset.
Public/Granted literature
- US20190272881A1 METHODS OF ERROR-BASED READ DISTURB MITIGATION AND MEMORY DEVICES UTILIZING THE SAME Public/Granted day:2019-09-05
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