- 专利标题: Resonant wavelength measurement apparatus and measurement method thereof
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申请号: US15960828申请日: 2018-04-24
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公开(公告)号: US10775237B2公开(公告)日: 2020-09-15
- 发明人: Cheng-Sheng Huang , Chih-Wei Chang , Shi-Ting Chen
- 申请人: NATIONAL CHIAO TUNG UNIVERSITY
- 申请人地址: TW Hsinchu
- 专利权人: NATIONAL CHIAO TUNG UNIVERSITY
- 当前专利权人: NATIONAL CHIAO TUNG UNIVERSITY
- 当前专利权人地址: TW Hsinchu
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@52834e55
- 主分类号: G01J3/12
- IPC分类号: G01J3/12 ; G01J3/02 ; G01N21/77 ; G01J3/28
摘要:
Disclosed is a resonant wavelength measurement apparatus, including a light source and a measurement unit. The measurement unit has a guided-mode resonance filter and a photosensitive element. The guided-mode resonance filter has a plurality of resonant areas, and each resonant area has a different filtering characteristic, to receive first light in the light source transmitted by a sensor or receive second light in the light source reflected by the sensor. The first light has a first corresponding pixel on the photosensitive element, the second light has a second corresponding pixel on the photosensitive element, and the first corresponding pixel and the second corresponding pixel correspond to a same resonant wavelength.