- 专利标题: Semiconductor device and method of fabricating the same
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申请号: US16833914申请日: 2020-03-30
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公开(公告)号: US10777560B2公开(公告)日: 2020-09-15
- 发明人: Jonghyuk Park , Byoungho Kwon , Inho Kim , Hyesung Park , Jin-Woo Bae , Yanghee Lee , Inseak Hwang
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@56cb4161
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; H01L21/66
摘要:
Provided are a semiconductor device and a method of fabricating the same. The semiconductor device may include a semiconductor substrate including a first region and a second region, a dummy separation pattern provided on the second region of the semiconductor substrate to have a recessed region at its upper portion, a first electrode provided on the first region of the semiconductor substrate, a dielectric layer covering the first electrode, a second electrode provided on the dielectric layer, and a remaining electrode pattern provided in the recessed region. The second electrode and the remaining electrode pattern may be formed of a same material.
公开/授权文献
- US20200227419A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME 公开/授权日:2020-07-16
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