Invention Grant
- Patent Title: Substrate processing apparatus and substrate processing method
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Application No.: US15458327Application Date: 2017-03-14
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Publication No.: US10851468B2Publication Date: 2020-12-01
- Inventor: Tadashi Iino , Toru Ihara , Yoshihiro Kai , Yoichi Tokunaga
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Minato-ku
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2016-065660 20160329
- Main IPC: C25D17/08
- IPC: C25D17/08 ; H01L21/687 ; H01L21/67 ; C25D7/12 ; C25D17/00 ; C25D21/12 ; H01L21/288 ; H01L21/677

Abstract:
A substrate processing apparatus includes a holding device that includes a conductive member and holds a substrate, a conduction path structure that includes a conductive material and positioned such that the conduction path structure is in contact with the holding device, a supply device that supplies a processing liquid to the substrate held by the holding device, and a grounding structure including a variable resistance device that changes a resistance such that the grounding structure has a first end portion connected the conduction path structure and a second end portion connected to a ground potential.
Public/Granted literature
- US20170283977A1 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD Public/Granted day:2017-10-05
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