Invention Grant
- Patent Title: Microelectronic devices including two contacts
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Application No.: US16391600Application Date: 2019-04-23
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Publication No.: US10854514B2Publication Date: 2020-12-01
- Inventor: Tieh-Chiang Wu , Wen-Chieh Wang , Sheng-Wei Yang
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/764 ; H01L29/06 ; H01L27/108 ; H01L27/11582 ; H01L49/02 ; H01L29/49

Abstract:
A memory device with a dielectric layer or an air gap between contacts and a method of making the same are disclosed. The method comprises a series of steps including forming a plurality of conductive lines having trenches therebetween; forming a contact layer in the trench; and forming a dielectric layer interposed in the contact layer and configured to divide the contact layer into two contacts. The method also comprises removing the dielectric layer to form a space and forming a cap layer over the two contacts to form an air gap therein. The method further comprises forming a second air gap between the conductive line and the two contacts.
Public/Granted literature
- US20190252251A1 MICROELECTRONIC DEVICES INCLUDING TWO CONTACTS Public/Granted day:2019-08-15
Information query
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