Invention Grant
- Patent Title: X-ray diffraction apparatus
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Application No.: US15668746Application Date: 2017-08-04
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Publication No.: US10900913B2Publication Date: 2021-01-26
- Inventor: Takeshi Osakabe , Tetsuya Ozawa
- Applicant: Rigaku Corporation
- Applicant Address: JP Tokyo
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2016-160316 20160818
- Main IPC: G01N23/20
- IPC: G01N23/20 ; G01N23/04 ; G01N23/20008 ; G01N23/20025 ; G01N23/201 ; G01N23/207

Abstract:
An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.
Public/Granted literature
- US20180052121A1 X-RAY DIFFRACTION APPARATUS Public/Granted day:2018-02-22
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