Invention Grant
- Patent Title: Optoelectronic chip and method for testing photonic circuits of such chip
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Application No.: US16249530Application Date: 2019-01-16
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Publication No.: US10921370B2Publication Date: 2021-02-16
- Inventor: Patrick Le Maitre , Jean-Francois Carpentier
- Applicant: STMicroelectronics (Crolles 2) SAS
- Applicant Address: FR Crolles
- Assignee: STMicroelectronics (Crolles 2) SAS
- Current Assignee: STMicroelectronics (Crolles 2) SAS
- Current Assignee Address: FR Crolles
- Agency: Slater Matsil, LLP
- Priority: FR1851201 20180213
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G02B6/12 ; G02B6/27 ; G02B6/293 ; G01M11/00
Abstract:
The invention concerns an optoelectronic chip including a pair of optical inputs having a same bandwidth, and each being adapted to a different polarization, at least one photonic circuit to be tested, and an optical coupling device configured to couple the two inputs to the circuit to be tested.
Public/Granted literature
- US20190250212A1 Optoelectronic Chip and Method for Testing Photonic Circuits of Such Chip Public/Granted day:2019-08-15
Information query
