Invention Grant
- Patent Title: Semiconductor devices having a gate isolation layer and methods of manufacturing the same
-
Application No.: US16232369Application Date: 2018-12-26
-
Publication No.: US10930749B2Publication Date: 2021-02-23
- Inventor: Yong Ho Jeon , Jung Hyun Kim , Sung Woo Myung , Young Mook Oh , Dong Seok Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Myers Bigel, P.A.
- Priority: KR10-2018-0067407 20180612
- Main IPC: H01L29/423
- IPC: H01L29/423 ; H01L21/763 ; H01L21/8234 ; H01L27/088 ; H01L21/764

Abstract:
Semiconductor devices are provided. A semiconductor device includes a channel region that protrudes from a substrate. The semiconductor device includes a gate line on the channel region. Moreover, the semiconductor device includes a gate isolation layer that is between a first portion of the gate line and a second portion of the gate line. The gate isolation layer is in contact with the gate line and includes a gap that is in the gate isolation layer. Related methods of manufacturing a semiconductor device are also provided.
Information query
IPC分类: