Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US15860832Application Date: 2018-01-03
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Publication No.: US10962558B2Publication Date: 2021-03-30
- Inventor: Akihiro Yasui , Hitoshi Tokieda , Toshihide Orihashi , Yoshiaki Saito , Naoto Suzuki
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-171677 20120802
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/10 ; G01N35/00

Abstract:
An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.
Public/Granted literature
- US20180128847A1 AUTOMATIC ANALYZER Public/Granted day:2018-05-10
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