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公开(公告)号：US11662357B2
公开(公告)日：2023-05-30
申请号：US16646410
申请日：2018-10-29
Applicant: Hitachi High-Technologies Corporation
Inventor： Masashi Akutsu , Naoto Suzuki , Hiroki Fujita , Akihiro Yasui
CPC classification number: G01N35/02 , G01N35/00603 , A61K35/14 , A61M1/02 , A61P7/00 , G01N27/447 , G01N35/00 , G01N35/04 , G01N37/00 , G01N2035/00752 , G01N2035/00831
Abstract: This automated analysis device is provided with a plurality of analysis units for analyzing a specimen, a buffer portion which holds a plurality of specimen racks on which are placed specimen containers holding the specimen, a sampler portion which conveys the specimen racks held in the buffer portion to the analysis units, and a control portion which, when performing a process to deliver the specimen racks to the plurality of analysis units, outputs synchronization signals to all the plurality of analysis units, wherein the analysis unit performs a delivery process starting from the synchronization signal, and the analysis unit performs a delivery process starting from the synchronization signal.
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公开(公告)号：US11143665B2
公开(公告)日：2021-10-12
申请号：US16331594
申请日：2017-09-14
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor： Akihiro Yasui , Gorou Yoshida , Yoshiki Muramatsu , Isao Yamazaki
Abstract: An automatic analyzer (100) includes: a storage unit (21b) that stores various parameters of the automatic analyzer (100) in association with each of elevations used in the automatic analyzers (100), the parameters being optimized for each of the elevations; an input unit (21d) that acquires information of an elevation at which the automatic analyzer (100) is provided; and a controller (21a) that reads the parameters stored in the storage unit (21b) and sets the read parameters to the automatic analyzer (100) based on the elevation acquired by the input unit (21d). As a result, various parameters can be easily adjusted according to a usage environment of the device.
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公开(公告)号：US20180128847A1
公开(公告)日：2018-05-10
申请号：US15860832
申请日：2018-01-03
Applicant: Hitachi High-Technologies Corporation
Inventor： Akihiro Yasui , Hitoshi Tokieda , Toshihide Orihashi , Yoshiaki Saito , Naoto Suzuki
CPC classification number: G01N35/025 , G01N35/00584 , G01N35/1004
Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.
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公开(公告)号：US10962558B2
公开(公告)日：2021-03-30
申请号：US15860832
申请日：2018-01-03
Applicant: Hitachi High-Technologies Corporation
Inventor： Akihiro Yasui , Hitoshi Tokieda , Toshihide Orihashi , Yoshiaki Saito , Naoto Suzuki
Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.
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公开(公告)号：US11619639B2
公开(公告)日：2023-04-04
申请号：US16646465
申请日：2018-08-23
Applicant: Hitachi High-Technologies Corporation
Inventor： Akihiro Yasui , Tatsuya Fukugaki , Masashi Akutsu , Naoto Suzuki
Abstract: The present invention reduces the turnaround time of an automated analyzer. During a period when cyclic measurement by a measurement unit is unnecessary, a controller washes a reaction vessel using a washing cycle having a cycle time shorter than that of an analysis cycle. A single analysis cycle and a single washing cycle both include a reaction disc stopping period and rotation period. In the washing cycle, there is no time during the stopping period when a sample dispensing mechanism, reagent dispensing mechanism, or stirring mechanism operates but there is a time when a washing mechanism operates. The washing cycle stopping period is shorter than the analysis cycle stopping period. The amount of rotation of the reaction disk in the analysis cycle rotation period is the same as the amount of rotation of the reaction disk in the washing cycle rotation period.
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Patent Agency Ranking
公开(公告)号：US10184948B2
公开(公告)日：2019-01-22
申请号：US15245237
申请日：2016-08-24
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor： Akihiro Yasui , Yoshihiro Suzuki , Hitoshi Tokieda
Abstract: An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.
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公开(公告)号：US09442128B2
公开(公告)日：2016-09-13
申请号：US14352192
申请日：2012-10-12
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor： Akihiro Yasui , Yoshihiro Suzuki , Hitoshi Tokieda
CPC classification number: G01N35/0092 , G01N35/025 , G01N35/04 , G01N35/1002 , G01N35/1009 , G01N2035/0094 , G01N2035/0413 , G01N2035/0444 , G01N2035/1032
Abstract: An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.
Abstract translation: 即使在需要稀释/预处理和一般反应测量的物品混合的情况下，自动分析仪也能保持高处理能力和分配精度。 多个样品分送机构被独立地驱动，并且各自包括样品收集位置，用于收集样品的样品喷嘴和用于清洗样品喷嘴的洗涤槽。 样品分配机构被配置为从多个样品收集位置收集样品，并且独立地操作以将样品分配进行到反应盘上的反应容器中。 为需要稀释/预处理的样品和不需要稀释/预处理的样品中的每一个提供至少一个样品分配机构。 自动分析装置设置有用于使各机构以专用方式操作的控制装置。 分配样品使得在反应容器中不产生空位。
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公开(公告)号：US11231433B2
公开(公告)日：2022-01-25
申请号：US16078063
申请日：2017-01-31
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor： Yoshiki Muramatsu , Akihiro Yasui , Yoshihiro Suzuki , Yoichi Aruga
Abstract: The invention provides a highly reliable automatic analyzer and dispenser probe cleaning method that allows for the removal of leftover cleaning water from the outer wall surfaces of a probe without increasing the size of a cleaning bath and contaminating the outer wall surfaces of the probe. A cleaning bath 113 (108, 106) comprises: a cleaning water outlet 203 for discharging into the cleaning bath 113 (108, 116) the cleaning water supplied from a cleaning water supply mechanism 123; and a compressed air outlet 204, disposed on the trajectory of the cleaning water discharged from the cleaning water outlet 203, for discharging the compressed air supplied from a compressed air supply mechanism 124 toward a sample probe 111b or a reagent probe 120 inserted in the cleaning bath 113 (108, 106).
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公开(公告)号：US10690690B2
公开(公告)日：2020-06-23
申请号：US15567758
申请日：2016-04-07
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor： Akihiro Yasui , Saori Chida , Masaaki Hirano
Abstract: Provided is a specimen dispensing mechanism that includes a specimen nozzle dispensing a specimen to be analyzed in a specimen chamber to a reaction chamber by suctioning and ejecting the specimen, and the specimen dispensing mechanism is controlled so as to perform a specimen suctioning process of inserting the specimen nozzle into the specimen chamber and suctioning the specimen in the specimen chamber, a liquid suctioning process of suctioning a liquid by the specimen nozzle after the specimen suctioning process, and an ejection process of ejecting the liquid and a portion of the specimen to the empty reaction chamber from the specimen nozzle in this order. Thereby, it is possible to provide an automatic analyser and a method which are capable of dispensing a small amount of specimen with a high level of accuracy, without depending on the outer shape of a specimen nozzle or the viscosity of the specimen.
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公开(公告)号：US09891240B2
公开(公告)日：2018-02-13
申请号：US14418614
申请日：2013-07-25
Applicant: Hitachi High-Technologies Corporation
Inventor： Akihiro Yasui , Hitoshi Tokieda , Toshihide Orihashi , Yoshiaki Saito , Naoto Suzuki
CPC classification number: G01N35/025 , G01N35/00584 , G01N35/1004
Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.
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