Invention Grant
- Patent Title: High resolution electron energy analyzer
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Application No.: US16298755Application Date: 2019-03-11
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Publication No.: US10964522B2Publication Date: 2021-03-30
- Inventor: Xinrong Jiang , Christopher Sears , Nikolai Chubun
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: H01J37/05
- IPC: H01J37/05 ; H01J49/48

Abstract:
A high-resolution electron energy analyzer is disclosed. In one embodiment, the electron energy analyzer includes an electrostatic lens configured to generate an energy-analyzing field region, decelerate electrons of an electron beam generated by an electron source, and direct the decelerated electrons of the electron beam to the energy-analyzing field region. In another embodiment, the electron energy analyzer includes an electron detector configured to receive one or more electrons passed through the energy-analyzing field region. In another embodiment, the electron detector is further configured to generate one or more signals based on the one or more received electrons.
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