Invention Grant
- Patent Title: Memory controller determining endurance degradation, memory system including the same, and method of operating the memory controller
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Application No.: US16415906Application Date: 2019-05-17
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Publication No.: US10977120B2Publication Date: 2021-04-13
- Inventor: Eun Chu Oh , Jeong-ho Lee , Young-jin Cho
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2018-0141130 20181115
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C13/00 ; G11C29/52 ; H01L45/00

Abstract:
Provided are a memory controller determining degradation in endurance, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes: an error correction code (ECC) circuit configured to detect an error from data read from a memory device; and an endurance determination circuit configured to check a first counting value indicating a number of writing operations on the memory device and a second counting value indicating, based on the data read from the memory device, at least one of: a number of first memory cells of the memory device, each of the first memory cells having an error and a number of second memory cells of the memory device in a certain logic state, and configured to perform a first determination operation for determining whether endurance of the memory device has degraded based on a checking result.
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