Invention Grant
- Patent Title: Method and system for processing patterned structures
-
Application No.: US16067202Application Date: 2016-12-29
-
Publication No.: US10978321B2Publication Date: 2021-04-13
- Inventor: Igor Turovets
- Applicant: NOVA MEASURING INSTRUMENTS LTD.
- Applicant Address: IL Rehovot
- Assignee: NOVA MEASURING INSTRUMENTS LTD.
- Current Assignee: NOVA MEASURING INSTRUMENTS LTD.
- Current Assignee Address: IL Rehovot
- Agency: Browdy and Neimark, PLLC
- International Application: PCT/IL2016/051403 WO 20161229
- International Announcement: WO2017/115377 WO 20170706
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/3105 ; H01L21/321 ; H01L21/66

Abstract:
A system and method are presented for controlling a process applied to a structure comprising at least one of material removal and material deposition processes. The system comprises: a heating radiation source configured and operable to generate a temperature field profile across a processing area of the structure; and a control unit configured and operable to control operation of said heating radiation source in accordance with a predetermined pattern map within the processing area, so as to create a corresponding pattern selective profile of said temperature field across said processing area providing desired pattern selective distribution of at least one parameter characterizing the process applied to the processing area of the structure.
Public/Granted literature
- US20190027386A1 METHOD AND SYSTEM FOR PROCESSING PATTERNED STRUCTURES Public/Granted day:2019-01-24
Information query
IPC分类: