Invention Grant
- Patent Title: Methods and apparatus to detect and correct errors in destructive read non-volatile memory
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Application No.: US16122575Application Date: 2018-09-05
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Publication No.: US11016842B2Publication Date: 2021-05-25
- Inventor: Yuming Zhu , Manish Goel , Sai Zhang
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Michael A. Davis, Jr.; Charles A. Brill; Frank D. Cimino
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C29/52 ; G11C29/04 ; G11C29/42 ; G11C29/20 ; G06F11/10 ; G06F11/30 ; G11C16/26 ; G11C16/30 ; G11C11/22 ; G11C29/02
Abstract:
In described examples, data are stored in a destructive read non-volatile memory (DRNVM). The DRNVM includes an array of DRNVM cells organized as rows of data. The rows of data are subdivided into columns of code word symbols. Each column of code word symbols is encoded to store an error correction code symbol for each column of code word symbols.
Public/Granted literature
- US20190004897A1 METHODS AND APPARATUS TO DETECT AND CORRECT ERRORS IN DESTRUCTIVE READ NON-VOLATILE MEMORY Public/Granted day:2019-01-03
Information query
