Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US16086085Application Date: 2017-01-31
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Publication No.: US11041874B2Publication Date: 2021-06-22
- Inventor: Saori Chida , Yoichi Aruga , Akihiro Yasui , Yoshiki Muramatsu , Yoko Inoue , Hideto Tamezane
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2016-061085 20160325
- International Application: PCT/JP2017/003256 WO 20170131
- International Announcement: WO2017/163613 WO 20170928
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N21/59 ; G01N35/04 ; G01N35/00

Abstract:
The automatic analyzer includes: a member to be washed, such as a probe or a stirrer for contacting and stirring a liquid; a wash station in which the member to be washed is washed with a washing liquid; and a measuring part that measures an optical characteristic of an evaluation reagent contained in a reaction cell. A control unit brings the member to be washed that has been washed in the wash station into contact with the evaluation reagent, causes the measuring part to measure the optical characteristic after contact with the evaluation reagent, and calculates the amount of the washing liquid carried into the reaction cell by the member to be washed, based on the measured optical characteristic.
Public/Granted literature
- US20200096529A1 AUTOMATIC ANALYZER Public/Granted day:2020-03-26
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