Invention Grant
- Patent Title: Sputtering target and method for manufacturing the same
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Application No.: US15642652Application Date: 2017-07-06
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Publication No.: US11081326B2Publication Date: 2021-08-03
- Inventor: Shunpei Yamazaki , Motoki Nakashima , Haruyuki Baba
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi
- Agency: Robinson Intellectual Property Law Office
- Agent Eric J. Robinson
- Priority: JPJP2016-137190 20160711,JPJP2016-144334 20160722
- Main IPC: H01J37/34
- IPC: H01J37/34 ; H01L29/786 ; H01L29/66 ; H01L21/02 ; H01L27/12 ; C23C14/34 ; C23C14/08 ; B28B11/24 ; B28B1/00 ; C04B35/01 ; C04B35/453 ; C04B35/58 ; H01L29/423 ; H01L29/24 ; G02F1/1368 ; G02F1/1335 ; G02F1/1333

Abstract:
A novel metal oxide or a novel sputtering target is provided. A sputtering target includes a conductive material and an insulating material. The insulating material includes an oxide, a nitride, or an oxynitride including an element M1. The element M1 is one or more kinds of elements selected from Al, Ga, Si, Mg, Zr, Be, and B. The conductive material includes an oxide, a nitride, or an oxynitride including indium and zinc. A metal oxide film is deposited using the sputtering target in which the conductive material and the insulating material are separated from each other.
Public/Granted literature
- US20180012739A1 SPUTTERING TARGET AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2018-01-11
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