Invention Grant
- Patent Title: Verifying structural integrity of materials using reference impedance
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Application No.: US16469955Application Date: 2017-12-15
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Publication No.: US11105762B2Publication Date: 2021-08-31
- Inventor: Christopher R. Yungers , Subhalakshmi M. Falknor , David H. Redinger
- Applicant: 3M INNOVATIVE PROPERTIES COMPANY
- Applicant Address: US MN St. Paul
- Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee Address: US MN St. Paul
- Agent Sriram Srinivasan; Thomas M. Spielbauer
- International Application: PCT/US2017/066606 WO 20171215
- International Announcement: WO2018/112311 WO 20180621
- Main IPC: G01N27/24
- IPC: G01N27/24 ; G01N27/04 ; G01N27/20 ; G01R31/12

Abstract:
A measurement system may include a set of drive electrical contacts including a force electrical contact and a return electrical contact electrically coupled to a tested material, a measurement electrical contact electrically coupled to the tested material, a return node, a voltage source, and a control module. A circuit path between the voltage source and the return node may include a fixed resistor and the tested material. The control module may be configured to cause the voltage source to apply a voltage signal to the force electrical contact, cause a voltage drop across the fixed resistor to be measured, cause a measured voltage to be measured using the measurement electrical contact, determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage, and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance.
Public/Granted literature
- US20190383763A1 VERIFYING STRUCTURAL INTEGRITY OF MATERIALS USING REFERENCE IMPEDANCE Public/Granted day:2019-12-19
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