Suppressing thermally induced voltages for verifying structural integrity of materials

    公开(公告)号:US11609203B2

    公开(公告)日:2023-03-21

    申请号:US17303867

    申请日:2021-06-09

    Abstract: The disclosure describes techniques for detecting a crack or defect in a material. The technique may include applying an electrical signal to a first electrode pair electrically coupled to the material. The technique also may include, while applying the electrical signal to the first electrode pair, determining a measured voltage between a second, different electrode pair. At least one electrode of the second, different electrode pair is electrically coupled to the material. The technique may further include determining a corrected measured voltage by suppressing a thermally induced voltage from the measured voltage and determining whether the material includes a crack or other defect based on the corrected measured voltage.

    Verifying structural integrity of materials

    公开(公告)号:US11112374B2

    公开(公告)日:2021-09-07

    申请号:US16469900

    申请日:2017-12-15

    Abstract: A method may include coupling a first electrical connector of an article to a second electrical connector of a measurement device. The article may include a tested material, the first electrical connector, and a plurality of electrical contacts electrically connected to the first electrical connector. The measurement device may include a power source and a user interface. The method also may include causing, by a controller, an electrical signal to be applied to a pair of drive electrical contacts from the plurality of electrical contacts. The method further may include receiving, by the controller, from an analog-to-digital converter, a measured voltage measured using a measurement electrical contact from the plurality of electrical contacts. The method also may include determining, by the controller, whether the tested material includes a crack or other defect based on the measured voltage.

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