Invention Grant
- Patent Title: Configuring iterative error correction parameters using criteria from previous iterations
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Application No.: US16806777Application Date: 2020-03-02
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Publication No.: US11146291B2Publication Date: 2021-10-12
- Inventor: Eyal En Gad , Zhengang Chen , Sivagnanam Parthasarathy , Yoav Weinberg
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30 ; G08C25/00 ; H03M13/00 ; H04L1/00 ; H03M13/11 ; H03M13/09 ; H03M13/29 ; H03M13/15

Abstract:
A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative LDPC correction process, wherein at least one iteration after a first iteration in the LDPC correction process uses a criterion based at least partially on a previous iteration or partial iteration.
Public/Granted literature
- US20210273652A1 CONFIGURING ITERATIVE ERROR CORRECTION PARAMETERS USING CRITERIA FROM PREVIOUS ITERATIONS Public/Granted day:2021-09-02
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