- 专利标题: Constrained cell placement
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申请号: US16686711申请日: 2019-11-18
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公开(公告)号: US11176303B2公开(公告)日: 2021-11-16
- 发明人: Yen-Hung Lin , Chung-Hsing Wang , Yuan-Te Hou
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- 主分类号: G06F7/50
- IPC分类号: G06F7/50 ; G06F30/392 ; G06F111/04
摘要:
The present disclosure describes an example method for cell placement in an integrated circuit layout design. The method includes retrieving, from a cell library, first and second cells each including a first local metal track proximate to a top boundary and a second local metal track proximate to a bottom boundary. The method includes placing, by a processor, the first and second cells in a layout area including global metal tracks of first and second types. Each global metal track of the first type and each global metal tracks of the second type alternate between one another in the layout area. The first and second local metal tracks of the first cell is aligned with adjacent first global metal track of the first and second types, respectively. The first and second local metal tracks of the second cell is aligned with adjacent second global metal track of the first and second types, respectively.
公开/授权文献
- US20200082046A1 CONSTRAINED CELL PLACEMENT 公开/授权日:2020-03-12
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