Invention Grant
- Patent Title: Delay fault testing of pseudo static controls
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Application No.: US16737548Application Date: 2020-01-08
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Publication No.: US11194645B2Publication Date: 2021-12-07
- Inventor: Aravinda Acharya , Wilson Pradeep , Prakash Narayanan
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Brian D. Graham; Charles A. Brill; Frank D. Cimino
- Priority: IN201741014017 20170420
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G01R31/3185 ; G01R31/317 ; G11C29/56 ; G11C29/12 ; G11C29/20 ; G11C29/32 ; G11C29/50 ; G11C29/14 ; G06F11/26 ; G01R31/14 ; G11C29/10 ; G11C29/36

Abstract:
A circuit includes a dynamic core data register (DCDR) cell that includes a data register, a shift register and an output circuit to route the output state of the data register or the shift register to an output of the DCDR in response to an output control input. A clock gate having a gate control input controls clocking of the shift register in response to a first scan enable signal. An output control gate controls the output control input of the output circuit and controls which outputs from the data register or the shift register are transferred to the output of the output circuit in response to a second scan enable signal. The first scan enable signal and the second scan enable signal to enable a state transition of the shift register at the output of the DCDR.
Information query