Invention Grant
- Patent Title: Test socket and test apparatus having the same, manufacturing method for the test socket
-
Application No.: US17204186Application Date: 2021-03-17
-
Publication No.: US11199577B2Publication Date: 2021-12-14
- Inventor: Chang Su Oh , Bo Hyun Kim
- Applicant: TSE CO., LTD.
- Applicant Address: KR Chungcheongnam-do
- Assignee: TSE CO., LTD.
- Current Assignee: TSE CO., LTD.
- Current Assignee Address: KR Chungcheongnam-do
- Priority: KR10-2020-0033952 20200319
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/067 ; G01R35/00 ; G01R31/28 ; G01R15/12

Abstract:
The present invention relates to a test socket configured to electrically connect a tester generating a test signal and a device under inspection to each other includes a nonelastic electrically-conductive housing having a plurality of housing holes passing therethrough in a thickness direction, an insulating coating layer applied on at least an upper surface of the nonelastic electrically-conductive housing and a circumference of each of the plurality of housing hole, and an electrically-conductive part formed to have a configuration in which a plurality of electrically-conductive particles are contained in an elastic insulating material, disposed in the housing hole such that a lower end portion thereof may be connected to a signal electrode of the tester placed below the nonelastic electrically-conductive housing.
Public/Granted literature
- US20210293880A1 TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHOD FOR THE TEST SOCKET Public/Granted day:2021-09-23
Information query