Invention Grant
- Patent Title: Method of minimizing read-disturb-write effect of SRAM circuit and SRAM circuit thereof
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Application No.: US16876138Application Date: 2020-05-18
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Publication No.: US11200924B2Publication Date: 2021-12-14
- Inventor: Jui-Che Tsai , Chia-En Huang , Yu-Hao Hsu , Yih Wang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C7/12 ; G11C7/06

Abstract:
In an exemplary embodiment, the disclosure provides a memory circuit which includes a dual port memory cell for storing a binary value accessed through a first port and a second port, a first WL switch connected to the dual port memory cell and controlled by a first WL voltage, a second WL switch connected to the dual port memory cell and controlled by a second WL voltage, a BL connected to the first WL switch for accessing the memory cell through the first port and having a first BL voltage, a second BL connected to the second WL switch for accessing the memory cell through the second port and having a second BL voltage, a BL selection circuit connected to the second WL switch for selecting the second BL, and a BL voltage pull down circuit connected to the BL selection circuit and the second WL switch.
Public/Granted literature
- US20210098035A1 METHOD OF MINIMIZING READ-DISTURB-WRITE EFFECT OF SRAM CIRCUIT AND SRAM CIRCUIT THEREOF Public/Granted day:2021-04-01
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