Invention Grant
- Patent Title: System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
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Application No.: US17320852Application Date: 2021-05-14
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Publication No.: US11215572B2Publication Date: 2022-01-04
- Inventor: Wenbing Yun , Srivatsan Seshadri , Ruimin Qiao , Janos Kirz , Sylvia Jia Yun Lewis
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01N23/085

Abstract:
An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle. The crystal analyzer includes crystal planes curved along at least one direction and configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector that includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy. The plurality of x-ray detection elements are configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies above the second x-ray energy while suppressing measurements below the second x-ray energy.
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