Invention Grant
- Patent Title: Automatic analyzer and cleaning method
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Application No.: US16078063Application Date: 2017-01-31
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Publication No.: US11231433B2Publication Date: 2022-01-25
- Inventor: Yoshiki Muramatsu , Akihiro Yasui , Yoshihiro Suzuki , Yoichi Aruga
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2016-033090 20160224
- International Application: PCT/JP2017/003475 WO 20170131
- International Announcement: WO2017/145672 WO 20170831
- Main IPC: B08B3/04
- IPC: B08B3/04 ; G01N35/10 ; B08B9/02 ; B08B7/04 ; B08B3/02 ; B08B9/00 ; B08B5/02 ; B01L3/02

Abstract:
The invention provides a highly reliable automatic analyzer and dispenser probe cleaning method that allows for the removal of leftover cleaning water from the outer wall surfaces of a probe without increasing the size of a cleaning bath and contaminating the outer wall surfaces of the probe. A cleaning bath 113 (108, 106) comprises: a cleaning water outlet 203 for discharging into the cleaning bath 113 (108, 116) the cleaning water supplied from a cleaning water supply mechanism 123; and a compressed air outlet 204, disposed on the trajectory of the cleaning water discharged from the cleaning water outlet 203, for discharging the compressed air supplied from a compressed air supply mechanism 124 toward a sample probe 111b or a reagent probe 120 inserted in the cleaning bath 113 (108, 106).
Public/Granted literature
- US20190049477A1 AUTOMATIC ANALYZER AND CLEANING METHOD Public/Granted day:2019-02-14
Information query
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