Invention Grant
- Patent Title: Systems and methods for focus control in x-rays
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Application No.: US16666436Application Date: 2019-10-29
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Publication No.: US11246208B2Publication Date: 2022-02-08
- Inventor: Guoping Zhu , Jinglin Wu , Tieshan Zhang , Siming Chen , Xu Chu
- Applicant: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
- Current Assignee: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Metis IP LLC
- Priority: CN201910335861.8 20190424
- Main IPC: H05G1/52
- IPC: H05G1/52 ; H01J35/14 ; H05G1/58

Abstract:
A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.
Public/Granted literature
- US20200343069A1 SYSTEMS AND METHODS FOR FOCUS CONTROL IN X-RAYS Public/Granted day:2020-10-29
Information query
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