Systems and methods for focus control in x-rays

    公开(公告)号:US11246208B2

    公开(公告)日:2022-02-08

    申请号:US16666436

    申请日:2019-10-29

    IPC分类号: H05G1/52 H01J35/14 H05G1/58

    摘要: A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.

    Systems and methods for high voltage generation

    公开(公告)号:US11330696B2

    公开(公告)日:2022-05-10

    申请号:US16666438

    申请日:2019-10-29

    IPC分类号: H05G1/10 H05G1/32 H05G1/58

    摘要: The present disclosure relates to a high voltage generator including multiple high voltage generating modules configured to provide a total voltage. Each of the multiple high voltage generating modules may be configured to receive a driving pulse and generate a voltage component of the total voltage according to the driving pulse. The multiple high voltage generating modules may be in a series connection. Time points when the multiple high voltage generating modules receive driving pulses may be different, and waveforms of the driving pulses may be the same.

    Systems and methods for X-ray imaging

    公开(公告)号:US11058476B2

    公开(公告)日:2021-07-13

    申请号:US16666435

    申请日:2019-10-29

    摘要: The present disclosure relates to systems and methods for energy imaging. The method may include obtaining a reference waveform of a tube voltage of a radiation source of a scanner. The reference waveform may be formed based on a superposition of a sine wave and one or more harmonics corresponding to the sine wave. The method may include causing a high voltage generator to generate the tube voltage changing between a first voltage and a second voltage lower than the first voltage according to the reference waveform. The tube voltage may be provided to the radiation source for generating radiation rays. The method may further include causing the scanner to perform energy imaging.