- 专利标题: Method of manufacturing a semiconductor device, and associated semiconductor device and system
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申请号: US16786418申请日: 2020-02-10
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公开(公告)号: US11257670B2公开(公告)日: 2022-02-22
- 发明人: Shih-Wei Peng , Chia-Tien Wu , Jiann-Tyng Tzeng
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: WPAT, P.C., Intellectual Property Attorneys
- 代理商 Anthony King
- 主分类号: H01L23/58
- IPC分类号: H01L23/58 ; H01L21/02 ; H01L21/033
摘要:
A method of manufacturing a semiconductor device, including: providing a substrate including a first cell and a second cell that are arranged in a first direction; forming a plurality of first metal strips extending in the first direction and arranged in a second direction on a first plane; forming a first trench over a boundary between the first cell and the second cell, wherein a bottom surface of the first trench is on a second plane over the first plane; filling the first trench with a non-conductive material, resulting in a separating wall which extends in the first direction; and forming a plurality of second metal strips extending in the second direction on a third plane over the second plane, wherein a first second metal strip and a second second metal strip separated from each other by the separating wall; wherein the second direction is orthogonal to the first direction.
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