Invention Grant
- Patent Title: Cleaning method of substrate processing apparatus and substrate processing apparatus
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Application No.: US16744637Application Date: 2020-01-16
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Publication No.: US11260433B2Publication Date: 2022-03-01
- Inventor: Yoshihiro Takezawa , Daisuke Suzuki , Hiroyuki Hayashi , Sena Fujita , Tatsuya Miyahara , Jyunji Ariga , Shinya Kikuchi
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JPJP2019-007270 20190118
- Main IPC: B08B9/027
- IPC: B08B9/027 ; B08B5/00 ; H01L21/67

Abstract:
There is provided a cleaning method of a substrate processing apparatus comprising cleaning an inside of an exhaust pipe through which a gas of an inside of a processing container is exhausted. The cleaning the inside of the exhaust pipe includes: removing a deposit on a downstream side of an opening/closing valve in the exhaust pipe by supplying a first exhaust pipe cleaning gas containing fluorine to the downstream side of the opening/closing valve in the exhaust pipe in a state in which the opening/closing valve provided in a middle of the exhaust pipe is closed; and removing a deposit on an upstream side of the opening/closing valve in the exhaust pipe by supplying a second exhaust pipe cleaning gas not containing fluorine as a gas constituent element to the inside of the processing container in a state in which the opening/closing valve is opened.
Public/Granted literature
- US20200230666A1 Cleaning Method of Substrate Processing Apparatus and Substrate Processing Apparatus Public/Granted day:2020-07-23
Information query
IPC分类: