Invention Grant
- Patent Title: Method for forming a via hole self-aligned with a metal block on a substrate
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Application No.: US17110631Application Date: 2020-12-03
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Publication No.: US11270912B2Publication Date: 2022-03-08
- Inventor: Martin O'Toole , Christopher Wilson , Zsolt Tokei , Ryan Ryoung han Kim
- Applicant: IMEC VZW
- Applicant Address: BE Leuven
- Assignee: IMEC VZW
- Current Assignee: IMEC VZW
- Current Assignee Address: BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: EP19215615 20191212
- Main IPC: H01L21/768
- IPC: H01L21/768

Abstract:
Example embodiments relate to methods for forming via holes self-aligned with metal blocks on substrates. One embodiment includes a method where the substrate includes an interlayer dielectric layer. The method includes forming a metallic layer on the interlayer dielectric layer. The method also includes forming a dielectric layer on the metallic layer and forming a plurality of parallel spacer line structures on the dielectric layer. In addition, the method includes forming a sidewall oxide, a first sacrificial layer, and an opening in the first sacrificial layer. Further, the method includes etching the dielectric layer and removing the first sacrificial layer. Additionally, the method includes forming a second sacrificial layer, forming an opening in the second sacrificial layer, depositing a metal block on the metallic layer, and removing the second sacrificial layer. Still further, the method includes etching the metallic layer and the interlayer dielectric layer to form a via hole.
Public/Granted literature
- US20210183698A1 Method for Forming a Via Hole Self-aligned with a Metal Block on a Substrate Public/Granted day:2021-06-17
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