A faceted integrated-circuit die includes a concave facet with an increased interconnect breakout area available to an adjacent device such as a rectangular IC die that is nested within the form factor of the concave facet. The concave facet form factor includes a ledge facet and a main-die facet. Multiple nested faceted IC dice are disclosed for increasing interconnect breakout areas and package miniaturization. A faceted silicon interposer has a concave facet that also provides an increased interconnect breakout area and package miniaturization.