Invention Grant
- Patent Title: Composite wafer, semiconductor device and electronic component
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Application No.: US16874146Application Date: 2020-05-14
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Publication No.: US11302579B2Publication Date: 2022-04-12
- Inventor: Paul Ganitzer , Carsten von Koblinski , Thomas Feil , Gerald Lackner , Jochen Mueller , Martin Poelzl , Tobias Polster
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Murphy, Bilak & Homiller, PLLC
- Priority: DE102016103683.8 20160301
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/8234 ; H01L21/56 ; H01L21/78 ; H01L23/495 ; H01L21/762 ; H01L21/768 ; H01L25/065 ; H01L23/31

Abstract:
In an embodiment, a composite semiconductor substrate includes a first polymer layer and a plurality of semiconductor dies having a first surface, a second surface opposing the first surface, side faces extending between the first surface and the second surface and a first metallization structure on the first surface. Edge regions of the first surface and at least portions of the side faces are embedded in the first polymer layer. At least one metallic region of the first metallization structure is exposed from the first polymer layer. A second metallization structure is arranged on the second surface of the plurality of semiconductor dies. A second polymer layer is arranged on edge regions of the second surface of the plurality of semiconductor dies and on the first polymer layer in regions between the side faces of neighbouring ones of the plurality of semiconductor dies.
Public/Granted literature
- US20200273750A1 Composite Wafer, Semiconductor Device and Electronic Component Public/Granted day:2020-08-27
Information query
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