Invention Grant
- Patent Title: Metal oxide semiconductor integrated circuit basic unit
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Application No.: US17126069Application Date: 2020-12-18
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Publication No.: US11335785B2Publication Date: 2022-05-17
- Inventor: Ping Li , Yongbo Liao , Chenxi Peng , Yaosen Li , Ruihong Nie , Ke Feng , Xianghe Zeng , Ruifeng Tang , Jiarui Zou , Zhaoxi Hu , Fan Lin
- Applicant: University of Electronic Science and Technology of China
- Applicant Address: CN Chengdu
- Assignee: University of Electronic Science and Technology of China
- Current Assignee: University of Electronic Science and Technology of China
- Current Assignee Address: CN Chengdu
- Agency: Matthias Scholl P.C.
- Agent Matthias Scholl
- Priority: CN201911306288.4 20191218
- Main IPC: H01L29/02
- IPC: H01L29/02 ; H01L29/417 ; H01L29/16 ; H01L29/20 ; H01L29/423 ; H01L29/66 ; H01L29/78 ; H02M7/537

Abstract:
A MOS integrated circuit basic unit includes: a drain semiconductor region; a lightly doped drain region; a channel semiconductor region; a source semiconductor region; a source electrode; a gate electrode; a gate dielectric layer; and a drain electrode. The drain semiconductor region is the bottom of the basic unit. The gate electrode has a ring structure, which surrounds the channel semiconductor region, the source semiconductor region and the lightly doped drain region. The upper surface of the gate electrode is aligned to the upper surface of the source semiconductor region; and a bottom surface of the gate electrode is lower than an interface of the lightly doped drain region and the drain semiconductor region. The gate dielectric layer is disposed between the gate electrode and the adjacent functional layer. The drain semiconductor region is connected to the drain electrode of the basic unit.
Public/Granted literature
- US20210226022A1 METAL OXIDE SEMICONDUCTOR INTEGRATED CIRCUIT BASIC UNIT Public/Granted day:2021-07-22
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