A method is provided for testing discrete output signals of a device-under-test (DUT). The method includes receiving an electrical quantity at each conductive path of a plurality of conductive paths that are each coupled to respective discrete output signals of the DUT in one-to-one correspondence. The method further includes controlling application of the electrical quantity to each of the conductive path independent of application of the electrical quantity along the other conductive paths, so that a the electrical quantity is applied simultaneously to all of the conductive paths, the electrical quantity applied to each conductive path being toggled at a unique frequency having a unique period. Accordingly, a characteristic of the electrical quantity at each of the respective test output conductors over the duration of the longest period of the unique periods is indicative of any disturbance between the discrete output signals associated with the test output conductor and all of the other discrete output signals.