Invention Grant
- Patent Title: Testing system and method of starting testing system
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Application No.: US16056584Application Date: 2018-08-07
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Publication No.: US11366127B2Publication Date: 2022-06-21
- Inventor: Ken Nishikawa , Tetsuya Oda , Hidetaka Hayama
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Metrolex IP Law Group, PLLC
- Priority: JPJP2017-156089 20170810
- Main IPC: G01N1/00
- IPC: G01N1/00 ; G01N35/00 ; G01N1/28 ; G01N1/30

Abstract:
A testing system according to one or more embodiments may include: a smear preparing apparatus that prepares a smear slide by smearing a sample on a glass slide; a smear transporting apparatus that transports the smear slide; a controller; and a display part. The controller may cause the display part to display a selection screen on which one or more of the smear preparing apparatus and the smear transporting apparatus can be selected. Based on a selection on the selection screen, the one or more of the smear preparing apparatus and the smear transporting apparatus selected on the selection screen may run respective start operations.
Public/Granted literature
- US20190049474A1 TESTING SYSTEM AND METHOD OF STARTING TESTING SYSTEM Public/Granted day:2019-02-14
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