- 专利标题: Workpiece cutting method
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申请号: US16605300申请日: 2018-04-12
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公开(公告)号: US11413708B2公开(公告)日: 2022-08-16
- 发明人: Takeshi Sakamoto , Tomoya Taguchi
- 申请人: HAMAMATSU PHOTONICS K.K.
- 申请人地址: JP Hamamatsu
- 专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人地址: JP Hamamatsu
- 代理机构: Faegre Drinker Biddle & Reath LLP
- 优先权: JPJP2017-081527 20170417
- 国际申请: PCT/JP2018/015425 WO 20180412
- 国际公布: WO2018/193970 WO 20181025
- 主分类号: B23K26/364
- IPC分类号: B23K26/364 ; B23K26/53 ; B23K26/38 ; H01L21/3065 ; H01L21/311 ; H01L21/78 ; B23K101/40
摘要:
An object cutting method includes: a first step of preparing an object to be processed including a single crystal silicon substrate and a functional device layer provided on a first main surface side and forming an etching protection layer on a second main surface of the object; a second step of irradiating the object with laser light to form at least one row of modified regions in the single crystal silicon substrate and to form a fracture in the object so as to extend between the at least one row of modified regions and a surface of the etching protection layer; and a third step of performing dry etching on the object from the second main surface side, in a state in which the etching protection layer is formed on the second main surface, to form a groove opening to the second main surface.
公开/授权文献
- US20210053158A1 WORKPIECE CUTTING METHOD 公开/授权日:2021-02-25
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