Invention Grant
- Patent Title: Substrate inspection device that inspects application quality of adhesive
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Application No.: US16535563Application Date: 2019-08-08
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Publication No.: US11452250B2Publication Date: 2022-09-20
- Inventor: Ikuo Futamura , Tsuyoshi Ohyama , Norihiko Sakaida
- Applicant: CKD Corporation
- Applicant Address: JP Aichi
- Assignee: CKD Corporation
- Current Assignee: CKD Corporation
- Current Assignee Address: JP Aichi
- Agency: Osha Bergman Watanabe & Burton LLP
- Priority: JPJP2017-021781 20170209
- Main IPC: H05K13/08
- IPC: H05K13/08 ; G06T7/11 ; G01N21/956 ; G06T7/00 ; H05K3/34 ; H05K13/04

Abstract:
A substrate inspection device that is placed on an upstream side of a component mounting machine that mounts an electronic component on solder that is printed on a substrate by a solder printing machine, and that inspects the solder and a thermosetting adhesive applied on the substrate, the substrate inspection device including: an irradiator that irradiates the solder and the adhesive with light; an imaging device that takes an image of the irradiated solder and the irradiated adhesive; and a processor that: generates actual solder position information of a solder group that the electronic component is mounted on based on the image, wherein the solder group includes two or more solders; generates, based on design data or manufacturing data, ideal solder inspection reference information indicating a reference inspection position and/or a reference inspection range of the solder included in the solder group.
Information query