Invention Grant
- Patent Title: High pressure and high temperature anneal chamber
-
Application No.: US16849604Application Date: 2020-04-15
-
Publication No.: US11462417B2Publication Date: 2022-10-04
- Inventor: Jean Delmas , Steven Verhaverbeke , Kurtis Leschkies
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: H01L21/324
- IPC: H01L21/324 ; H01L21/67

Abstract:
Disclosed herein is an apparatus and method for annealing semiconductor substrates. In one example a temperature-controlled fluid circuit includes a condenser configured to fluidly connect to an internal volume of a processing chamber. The processing chamber has a body, the internal volume is within the body. The condenser is configured to condense a processing fluid into liquid phase. A source conduit includes a first terminal end that couples to a first port on the body of the processing chamber. The source conduit includes a second terminal end. The first terminal end couples to a gas panel. The gas panel is configured to provide a processing fluid into the internal volume of the processing chamber. A gas conduit includes a first end. The first end couples to the condenser and a second end. The second end is configured to couple to a second port on the body of the processing chamber.
Public/Granted literature
- US20200243345A1 HIGH PRESSURE AND HIGH TEMPERATURE ANNEAL CHAMBER Public/Granted day:2020-07-30
Information query
IPC分类: