- 专利标题: Memory circuit and method of operating the same
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申请号: US17235297申请日: 2021-04-20
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公开(公告)号: US11468929B2公开(公告)日: 2022-10-11
- 发明人: Yi-Tzu Chen , Ching-Wei Wu , Hau-Tai Shieh , Hung-Jen Liao , Fu-An Wu , He-Zhou Wan , XiuLi Yang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. , TSMC CHINA COMPANY, LIMITED
- 申请人地址: TW Hsinchu; CN Songjiang
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,TSMC CHINA COMPANY, LIMITED
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,TSMC CHINA COMPANY, LIMITED
- 当前专利权人地址: TW Hsinchu; CN Songjiang
- 代理机构: Hauptman Ham, LLP
- 优先权: CN202110218704.6 20210226
- 主分类号: G11C16/10
- IPC分类号: G11C16/10 ; G11C7/22 ; G11C7/12 ; G11C7/14 ; G11C7/10
摘要:
A memory circuit includes a NAND logic gate, a first N-type transistor, a second N-type transistor, a first inverter and a first latch. The NAND logic gate is configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The first N-type transistor is coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The second N-type transistor is coupled to the first N-type transistor and a reference voltage supply, and configured to receive a first clock signal. The first inverter is coupled to the NAND logic gate, and configured to output a data signal inverted from the first signal. The first latch is coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.
公开/授权文献
- US20220277781A1 MEMORY CIRCUIT AND METHOD OF OPERATING THE SAME 公开/授权日:2022-09-01
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