Invention Grant
- Patent Title: Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures
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Application No.: US17097275Application Date: 2020-11-13
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Publication No.: US11501973B2Publication Date: 2022-11-15
- Inventor: Petri Raisanen , Mark Olstad , Jose Alexandro Romero , Dong Li , Ward Johnson , Peijun Chen
- Applicant: ASM IP Holding B.V.
- Applicant Address: NL Almere
- Assignee: ASM IP Holding B.V.
- Current Assignee: ASM IP Holding B.V.
- Current Assignee Address: NL Almere
- Agency: Snell & Wilmer LLP.
- Main IPC: H01L21/285
- IPC: H01L21/285 ; H01L29/49 ; C23C16/455 ; C23C16/32 ; H01L21/28 ; H01L29/78

Abstract:
A method of depositing a material film on a substrate within a reaction chamber by a cyclical deposition process is disclosed. The method may include: contacting the substrate with a first vapor phase reactant and purging the reaction chamber with a first main purge. The method also includes: contacting the substrate with a second vapor phase reactant by two or more micro pulsing processes, wherein each micro pulsing process comprises: contacting the substrate with a micro pulse of a second vapor phase reactant; and purging the reaction chamber with a micro purge, wherein each of the micro pulses of the second vapor phase reactant provides a substantially constant concentration of the second vapor phase reactant into the reaction chamber. The method may also include; purging the reaction chamber with a second main purge. Device structures including a material film deposited by the methods of the disclosure are also disclosed.
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