Invention Grant
- Patent Title: Plasma doping of gap fill materials
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Application No.: US15930875Application Date: 2020-05-13
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Publication No.: US11508573B2Publication Date: 2022-11-22
- Inventor: Santanu Sarkar , Jay Steven Brown , Shu Qin , Yongjun Jeff Hu , Farrell Martin Good
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/3105 ; H01L27/24

Abstract:
In a variety of processes for forming electronic devices that use spin-on dielectric materials, properties of the spin-on dielectric materials can be enhanced by curing these materials using plasma doping. For example, hardness and Young's modulus can be increased for the cured material. Other properties may be enhanced. The plasma doping to cure the spin-on dielectric materials uses a mechanism that is a combination of plasma ion implant and high energy radiation associated with the species ionized. In addition, physical properties of the spin-on dielectric materials can be modified along a length of the spin-on dielectric materials by selection of an implant energy and dopant dose for the particular dopant used, corresponding to a selection variation with respect to length.
Public/Granted literature
- US20210202243A1 PLASMA DOPING OF GAP FILL MATERIALS Public/Granted day:2021-07-01
Information query
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