- Patent Title: Vertical transistor and method of forming the vertical transistor
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Application No.: US16776690Application Date: 2020-01-30
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Publication No.: US11520768B2Publication Date: 2022-12-06
- Inventor: Fee Li Lie , Shogo Mochizuki , Junli Wang
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: McGinn, I.P. Law Group, PLLC.
- Agent Robert Sullivan, Esq.
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/06 ; G06F16/23 ; G06F16/13 ; G06F16/16 ; G06F16/188 ; G06F11/14 ; G06F9/455

Abstract:
A semiconductor device includes a source/drain (S/D) region, a fin structure formed on the S/D region, and a gate structure formed on the fin structure so that a space is formed between the S/D region and the gate structure.
Public/Granted literature
- US20200167331A1 VERTICAL TRANSISTOR AND METHOD OF FORMING THE VERTICAL TRANSISTOR Public/Granted day:2020-05-28
Information query
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