Invention Grant
- Patent Title: Operation method of nonvolatile memory device
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Application No.: US17232370Application Date: 2021-04-16
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Publication No.: US11527296B2Publication Date: 2022-12-13
- Inventor: Doo-Yeun Jung , Young-Jin Cho , Bu-Il Nam , Nari Lee , Yeji Nam , Sangyong Yoon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2020-0049865 20200424,KR10-2020-0110608 20200831
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/24 ; G11C16/30 ; G11C16/10 ; G11C16/08 ; G11C16/16

Abstract:
An operation method of a nonvolatile memory device which includes a memory block having wordlines includes performing an erase on the memory block, performing a block verification on the memory block by using a 0-th erase verification voltage, performing a delta verification on the memory block by using a first erase verification voltage different from the 0-th erase verification voltage when a result of the block verification indicates a pass, and outputting information about an erase result of the memory block based on the result of the block verification or a result of the delta verification. The delta verification includes generating delta counting values respectively corresponding to wordline groups by using the first erase verification voltage, generating a delta value based on the delta counting values, and comparing the delta value and a first reference value.
Public/Granted literature
- US20210335434A1 OPERATION METHOD OF NONVOLATILE MEMORY DEVICE Public/Granted day:2021-10-28
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