Invention Grant
- Patent Title: Semiconductor device and method of forming thereof
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Application No.: US17093345Application Date: 2020-11-09
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Publication No.: US11532714B2Publication Date: 2022-12-20
- Inventor: Li-Zhen Yu , Huan-Chieh Su , Lin-Yu Huang , Cheng-Chi Chuang , Chih-Hao Wang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/417
- IPC: H01L29/417 ; H01L21/3065 ; H01L21/768 ; H01L23/522 ; H01L23/48 ; H01L21/8234 ; H01L23/528

Abstract:
A device includes a device layer including a first transistor, a first interconnect structure on a front-side of the device layer, and a second interconnect structure on a backside of the device layer. The second interconnect structure includes a first dielectric material on the backside of the device layer, a contact extending through the first dielectric material to a first source/drain region of the first transistor, and a first conductive layer including a first conductive line electrically connected to the first source/drain region through the contact.
Public/Granted literature
- US20210408249A1 Semiconductor Device and Method of Forming Thereof Public/Granted day:2021-12-30
Information query
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